event
Thursday 15 May 2014: Low Voltage Field Emission Scanning Electron Microscopy: Design and Applications
Trevor Groves - Agilent Technologies
HAR/170 (3D Visualisation Suite) 14:00-15:00
Agilent's 8500 FE-SEM low voltage, Field Emission Scanning Electron Microscope (FESEM) employs a novel award winning electrostatic lens design and high sensitivity Multi Channel Plate electron detector capable of 10nm resolution in an easy to use, maintenance free, compact space saving design.
This innovative design allows for high resolution imaging of a multitude of specimens from a variety of research sectors including Biological and Natural Products, Materials, including Polymers and Graphene, Semi-conductors and Geological. Most of these samples can be studied without the need for metal coating, which coupled with the low electron voltage beam, can give revealing information about the true surface structures often over looked when using higher beam voltages.
In today's presentation given by Agilent Technologies European Application Specialist Trevor Groves, the design, construction and advantages of the Agilent 8500 FESEM will be described, supported by real case Low Voltage Applications covering all the technical sectors already mentioned.
