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Photo of Dr Rosie Cobley

Dr Rosie Cobley


Copyright Notice: Any articles made available for download are for personal use only. Any other use requires prior permission of the author and the copyright holder.

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  • Cobley, R.A. Wright, C.D., Ashwin, P., and Vazquez J., A Model for Multilevel Phase-Change Memories incorporating Resistance Drift Effects, IEEE J EDS, pp pp15- 23, vol. Vol. 3 No 1


  • Wright CD, Au YY, Aziz MM, Bhaskaran H, Cobley R, Rodriguez-Hernadez, G, Hosseini, P, Pernice, WHP and Wang, L, Novel application possibilities for phase-change materials and devices, EPCOS 2013, Berlin


  • Cobley R.A. and Wright C.D A multi-level phase change memory SPICE model incorporating drift effects, IEEE Trans on Electron Devices


  • Cobley, R.A. and Wright, C.D Parameterized SPICE Model for a Phase-Change RAM Device, IEEE Transactions on Electron Devices, pp 112-118, vol. 53


  • Cobley RA and Wright CD Simple paramerised Pspice models of PCRAM devices, Minatec, Grenoble
  • Cobley, R.A. and Wright, C.D Spice modelling of PCRAM devices, IEE Proc: Science Measurement and Technology, pp 237-239, vol. 150 (5)


  • Cobley RA and Wright CD Spice modelling of PCRAM devices, European workshop IMST, Exeter


  • Cobley RA DFT of mixed systems on a chip, UK Design Automation Forum, Abingdon


  • Cobley, R.A The use of low cost FPGAs for tone detection circuits, 1st international symposium on communication systems and digital signal processing, Sheffield, pp 109 -112, vol. Mar


  • Cobley R.A Approaches to on-chip testing of mixed signal macros, European Design & Test conf. EDTC96, Paris, pp 553 - 557, vol. Mar
  • Cobley RA A pilot educational project in Concurrent Engineering, Int Conf on Concurrent Engineering, CEEDA96, Poole, pp pp79-86


  • Cobley, R.A Testing of analogue to digital converter macros, 3rd IEEE European Test conference, Rotterdam, pp 505 -506, vol. Apr


  • Cobley RA On-chip testing of ADCs, IEE Colloquium on Testing Mixed Signal Circuits, pp pp8/1-4
  • Cobley, R.A VLSI Design and CAE at Exeter University, IEEE Proc. G, pp 183-187, vol. 139


  • Cobley RA Design and test of VLSI circuits: A Eurochip perspective, IEE Colloquium on The Eurochip Project, pp pp 3/1-3
  • Cobley RA Educating modern engineers: CAD tools and communication, Conf on Women Eng. and Scientists, Warwick, pp pp 77E-80E
  • Cobley, R.A Developments for built-in self-test of mixed ASICs, IEEE European Test Conference, Munich, pp 512 -513, vol. Apr


  • Cobley, R.A An automated circuit design & test system for use by university students, CAE Journal, pp 19 - 22, vol. Feb


  • Cobley, R.A The introduction of electronics computer aided design facilities to engineering science students, Electronic Computer Aided Design, Ed. P L Jones and A. Buckley, Manchester University Press, pp 23 - 29
  • Cobley, R.A The design and test of low cost robotic sensor systems, 1st workshop on domestic robots , Newcastle-upon-Tyne, pp 119 -128, vol. Sep


  • Cobley RA The link from automated circuit design to fault testing, IEE Colloquium on Computer Aided Test and Diagnosis, London, pp pp 3/1-3
  • Cobley RA The application of fault testing to a railway signalling system, IEE Colloquium on Design for Testability


  • Cobley R.A The integration of professional CAD software into a CAD course for Engineering Science students, CTISS workshop on Computer in Engineering Education, pp pp17-26


  • Bland, R.J. and Cobley, R.A The introduction of electronic design to an Engineering Science core course, I.J.E.E.E, pp 293 -298, vol. 22
  • Cobley, R.A The development of a computer aided design course for undergraduate students of Engineering Science, CAE Journal, pp 118 -121, vol. 2

Showing 25 publications from UDB2.